ULTRA-HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE

ULTRA-HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPE UHR-TEM - LIBRA® 200 MC

UHR-TEM LIBRA®200MC/Carl Zeiss GmbH is used for atomic and micro-scale investigations in materials science of solid and soft materials (e.g. polymers). Combining the well-established LIBRA® 200 platform with state-of-the-art aberration correctors provides powerful new atomic-scale imaging and analytical capabilities. Improved resolution and chemical sensitivity give access to developing next-generation applications in additional fields such as life sciences, semiconductor and nanotechnology. UHR-TEM LIBRAâ 200 MC is equipped with monochromator, energy filter in column, image corrector, EELS (Electron Energy Loss Spectroscope), EDS (Energy Dispersive X-ray Spectroscope) and Lorentz lens. The working modes are: UHR-TEM, HAADF (High Angle Annular Dark Field), EELS, EFTEM (Energy-Filtered Transmission Electron Microscopy), EDS, SAED (Selected Area Electron Diffraction), precession diffraction, and STEM (Scanning Transmission Electron Microscopy).

UHR-TEM LIBRA®200MC/Carl Zeiss GmbH

Technical specifications:

  • Accelerating voltage: 40 to 200 kV (selectable)
  • Emitter: ZrO/W-field emitter system (Schottky)
  • Energy resolution: < 0.7 eV (limited by the energy spread of the emitter)
  • Resolution: HR - objective /Point to point: 0.24 nm; information limit: < 0.14 nm/ STEM/ Global and elastic BF/DF: 0.3 nm; HAADF: 0.3 nm
  • Probe diameter& Beam current: 0.5 nm; 80 pA / 0.3 nm; 10 pA attainable
  • Magnification ranges: Total range 80× to 1,000,000×; Low mag. range 80× to 4,000×; High mag. range  4,000× to 1,000,000×
  • Digital STEM attachment / Magnification range: 2,000× ¸ 5,000,000×
  • Spectrometer: In-column corrected OMEGA spectrometer for TEM image. Energy dispersive plane 1.85 µm/eV at 200 kV
  • Specimen stage: specimen drift £ 1 nm/min
  • Specimen holders: Fast exchange specimen holder for one 3 mm grid

Double Tilt Holder: a = ±30°; b= ±30°.

Services:  Morphological/topological, structural and compositional characterisation of metallic and insulator materials.