Electron microscopes are used to investigate crystallographic structure of different materials, including morphology/topology of a wide range of inorganic and organic specimens such as microorganisms, cells, large molecules, and biopsy samples. Industrially, electron microscopes are used for quality control and failure analysis.

Morphological/topological, structural and compositional characterisation of bulk materials and micro-and nanomaterials by electron microscopy is performed using the following equipment:

• Ultra-High Resolution Transmission Electron Microscope UHR-TEM LIBRA®200MC
• Scanning Electron Microscope SEM JEOL JSM 6390 with EDX facility and electron beam lithography module (XENOS XP G2) attached to it

The Scanning Electron Microscope (SEM) and Transmission Electron Microscope (TEM) are equipped with ENERGY-DISPERSIVE X-RAY SPECTROSCOPY (EDS) system, sometimes called Energy dispersive X-ray analysis (EDX/EDXA) which is an analytical technique used for the elemental analysis or chemical characterization of the samples.